• DocumentCode
    3197101
  • Title

    RF Breakdown in Normal Conducting Single-Cell Structures

  • Author

    Dolgashev, V.A. ; Tantawi, S.G. ; Nantista, C.D. ; Higashi, Y. ; Higo, T.

  • Author_Institution
    SLAC, Menlo Park, CA, 94025, USA
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    595
  • Lastpage
    599
  • Abstract
    Operating accelerating gradient in normal conducting accelerating structures is often limited by rf breakdown. The limit depends on multiple parameters, including input rf power, rf circuit, cavity shape and material. Experimental and theoretical study of the effects of these parameters on the breakdown limit in full scale structures is difficult and costly. We use 11.4 GHz single-cell traveling wave and standing wave accelerating structures for experiments and modeling of rf breakdown behavior. These test structures are designed so that the electromagnetic fields in one cell mimic the fields in prototype multicell structures for the X-band linear collider. Fields elsewhere in the test structures are significantly lower than that of the single cell. The setup uses matched mode converters that launch the circular TM01mode into short test structures. The test structures are connected to the mode launchers with vacuum rf flanges. This setup allows economic testing of different cell geometries, cell materials and preparation techniques with short turn-around time. Simple 2D geometry of the test structures simplifies modeling of the breakdown currents and their thermal effects.
  • Keywords
    Acceleration; Circuit testing; Conducting materials; Electric breakdown; Electromagnetic fields; Flanges; Geometry; Prototypes; Radio frequency; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1590501
  • Filename
    1590501