Title :
A microscope system for characterization of mechanical properties of small-scaled objects
Author :
Tohmyoh, H. ; Akanda, M.A.S. ; Saka, M.
Author_Institution :
Dept. of Nanomech., Tohoku Univ., Sendai, Japan
Abstract :
A new microscopy system for characterization of mechanical properties of small-scaled objects is reported. A force sensor, piezo stage, manual manipulators, etc. are integrated in a single platform and these are combined with a high-resolution digital microscope to acquire the load-displacement relationships of the small-scaled objects together with the corresponding deformation pattern of the objects during testing. A small-span bending test of ultrathin Pt wire is demonstrated and the results are discussed.
Keywords :
atomic force microscopy; bending; mechanical testing; nanowires; platinum; scanning electron microscopy; deformation pattern; digital microscope; small-scaled objects; small-span bending test; ultrathin platinum wire; Fitting; Force sensors; Loading; Microscopy; Testing; Wire;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5642853
