DocumentCode :
3197324
Title :
Fine pitch copper wire bonding introduction to high volume production
Author :
Appelt, Bernd K. ; Tseng, Andy ; Lai, Yi-Shao
Author_Institution :
ASE Group Inc., Santa Clara, CA, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
Keywords :
copper; corrosion; fine-pitch technology; integrated circuit interconnections; lead bonding; oxidation; commodity prices; corrosion; fine diameter copper wire bonding; fine pitch copper wire bonding; high volume production; malleable; mechanical property; oxidation; substrate interconnection; Bonding; Copper; Gold; Radio access networks; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642861
Filename :
5642861
Link To Document :
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