• DocumentCode
    3197420
  • Title

    Diffraction properties of multi-layer holograms

  • Author

    Fitio, V.M. ; Bobitski, Ya.W.

  • Author_Institution
    Nat. Univ., Lviv, Ukraine
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    206
  • Abstract
    Based on the theory of connected waves the peculiarities of diffraction of light on multi-layered holograms was analysed. For two-edged holograms depending on diffraction efficiency from wavelength of the falling light one can observe oscillations, the period of which can be generally determined by the distance between the subholograms. For a multilayered hologram consisting of subholograms depending on the diffraction efficiency from the wavelength only every m-l peak has a big amplitude, the angle´s width of this peak and the amplitudes of other peaks decrease with the increase of m. This case represents a multi-layer interferometer. The recording of a multilayered hologram can be done with the help of a simple hologram. Two edged and multilayered holograms as a matter of fact represent indivisible two rays and multi ray interferometers
  • Keywords
    holography; light diffraction; light interferometers; optical multilayers; diffraction efficiency; multi ray interferometers; multi-layer hologram diffraction properties; multi-layer interferometer; multilayered hologram; multilayered holograms; oscillations; two-edged holograms; Diffraction; Displacement measurement; Frequency measurement; Goniometers; Laser stability; Laser transitions; Optical reflection; Semiconductor lasers; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Laser and Fiber-Optical Networks Modeling, 2001. Proceedings of LFNM 2001. 3rd International Workshop on
  • Conference_Location
    Kharkiv
  • Print_ISBN
    0-7803-6680-8
  • Type

    conf

  • DOI
    10.1109/LFNM.2001.930247
  • Filename
    930247