Experimental test of local oscillator-induced performance limitation for pulse-mode passive frequency standards

Author

Dick, G.J. ; Stowers, D.A.

Author_Institution

Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA

fYear

1995

fDate

31 May-2 Jun 1995

Firstpage

175

Lastpage

177

Abstract

An experimental test of Local-Oscillator (L.O.) degradation of time-sequential passive oscillator performance was accomplished using the TAG-controlled crystal oscillator described in an accompanying paper. For this quantitative demonstration, an electronic frequency-counter discriminator replaced the trapped ion physics package in a closed-loop experiment. With a 10 second cycle time and 5 second dead time, L.O. limited stability was demonstrated in excellent agreement with theoretical calculations. The results are also in agreement with computer simulations and confirm previous noise analysis for the case of a passive standard with short pulse “Ramsey” interrogation

Keywords

atomic clocks; crystal oscillators; frequency measurement; measurement standards; Ramsey interrogation; TAG-controlled crystal oscillator; closed-loop system; electronic frequency-counter discriminator; local oscillator; noise analysis; pulse-mode atomic frequency standard; stability; time-sequential passive oscillator; Atomic measurements; Degradation; Electron traps; Frequency; Laboratories; Local oscillators; Paper technology; Propulsion; Stability; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-2500-1

Type

conf

DOI

10.1109/FREQ.1995.483899

Filename

483899