DocumentCode :
31980
Title :
CMOS Impedance Analyzer for Nanosamples Investigation Operating up to 150 MHz With Sub-aF Resolution
Author :
Bianchi, D. ; Ferrari, Giorgio ; Rottigni, Angelo ; Sampietro, Marco
Author_Institution :
DEIB, Politec. di Milano, Milan, Italy
Volume :
49
Issue :
12
fYear :
2014
fDate :
Dec. 2014
Firstpage :
2748
Lastpage :
2757
Abstract :
This work addresses the emerging need for investigating micro- and nano-devices by performing Impedance Spectroscopy with high-sensitivity yet at high bandwidth. To this goal a new circuital architecture has been implemented that overcomes the limitations of the classic transimpedance topology of noise and maximum operating frequency trade-off as well as of input capacitance stability concerns. Thanks to a two channel modulation/amplification/demodulation structure embedded into a feedback loop, high loop gain at all the working frequencies is obtained. Implemented in 0.35 μm CMOS, the IC works from 1 kHz up to 150 MHz, independently of the input capacitance value up to about 100 pF. The IC shows a resolution as good as 0.4 aF in the 100 kHz-150 MHz range (Vin = 1 V, BW = 50 Hz). The circuit directly provides two DC outputs proportional to the Real and Imaginary component of the DUT admittance so that no external lock-in structure or filter is required. The output bandwidth is adjustable from few tens of Hz up to 50 kHz, thus allowing both fast impedance tracking and high resolution impedance spectroscopy.
Keywords :
CMOS integrated circuits; circuit stability; nanoelectronics; CMOS impedance analyzer; DC outputs; DUT admittance; amplification; bandwidth 50 Hz; capacitance 0.4 aF; channel modulation; circuital architecture; demodulation structure; fast impedance tracking; feedback loop; frequency 1 kHz to 150 kHz; high loop gain; high resolution impedance spectroscopy; input capacitance stability; maximum operating frequency trade-off; microdevices; nanodevices; nanosamples; size 0.35 mum; sub-aF resolution; transimpedance topology; voltage 1 V; Bandwidth; Capacitance; Frequency modulation; Harmonic analysis; Impedance; Noise; Admittance measurement; impedance spectroscopy; impedance tracking; lock-in amplifier; transimpedance amplifier;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2345025
Filename :
6879492
Link To Document :
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