• DocumentCode
    31980
  • Title

    CMOS Impedance Analyzer for Nanosamples Investigation Operating up to 150 MHz With Sub-aF Resolution

  • Author

    Bianchi, D. ; Ferrari, Giorgio ; Rottigni, Angelo ; Sampietro, Marco

  • Author_Institution
    DEIB, Politec. di Milano, Milan, Italy
  • Volume
    49
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    2748
  • Lastpage
    2757
  • Abstract
    This work addresses the emerging need for investigating micro- and nano-devices by performing Impedance Spectroscopy with high-sensitivity yet at high bandwidth. To this goal a new circuital architecture has been implemented that overcomes the limitations of the classic transimpedance topology of noise and maximum operating frequency trade-off as well as of input capacitance stability concerns. Thanks to a two channel modulation/amplification/demodulation structure embedded into a feedback loop, high loop gain at all the working frequencies is obtained. Implemented in 0.35 μm CMOS, the IC works from 1 kHz up to 150 MHz, independently of the input capacitance value up to about 100 pF. The IC shows a resolution as good as 0.4 aF in the 100 kHz-150 MHz range (Vin = 1 V, BW = 50 Hz). The circuit directly provides two DC outputs proportional to the Real and Imaginary component of the DUT admittance so that no external lock-in structure or filter is required. The output bandwidth is adjustable from few tens of Hz up to 50 kHz, thus allowing both fast impedance tracking and high resolution impedance spectroscopy.
  • Keywords
    CMOS integrated circuits; circuit stability; nanoelectronics; CMOS impedance analyzer; DC outputs; DUT admittance; amplification; bandwidth 50 Hz; capacitance 0.4 aF; channel modulation; circuital architecture; demodulation structure; fast impedance tracking; feedback loop; frequency 1 kHz to 150 kHz; high loop gain; high resolution impedance spectroscopy; input capacitance stability; maximum operating frequency trade-off; microdevices; nanodevices; nanosamples; size 0.35 mum; sub-aF resolution; transimpedance topology; voltage 1 V; Bandwidth; Capacitance; Frequency modulation; Harmonic analysis; Impedance; Noise; Admittance measurement; impedance spectroscopy; impedance tracking; lock-in amplifier; transimpedance amplifier;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2345025
  • Filename
    6879492