DocumentCode
3198012
Title
Wafer Level Reliability
fYear
2011
fDate
16-20 Oct. 2011
Abstract
Presents slides from a workshop on wafer level reliability.
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
Conference_Location
South Lake Tahoe, CA
ISSN
1930-8841
Print_ISBN
978-1-4577-0113-9
Type
conf
DOI
10.1109/IIRW.2011.6142573
Filename
6142573
Link To Document