Title :
The Electrical and Optical Properties of CSS CDTE Thin Films Deposited in AR+O2 Atmosphere
Author :
Li, Bing ; Feng, Lianghuan ; Zheng, Jiagui ; Cai, Wei ; Cai, Yaping ; Zhang, Jingquan ; Li, Wei ; Wu, Lili ; Lei, Zhi
Author_Institution :
Coll. of Mater. Sci. & Eng., Sichuan Univ., Chengdu
Abstract :
The fabrication and properties of CdTe layer are most important to the performance of CdTe thin film solar cells, among their several function layers. In the paper, a technology of closed-space sublimation(CSS) in Ar+O2 atmosphere has been studied and a method of depositing CdTe thin films on smooth glass substrate has been developed. The structural properties of these films deposited in an appropriate CSS process have been investigated by XRD and SEM, which show that there are some changes by different abrading times. Then, the optical and electrical properties of CdTe films deposited on glass in different fractional pressure of O2 have been studied, and the effects of post-treatment on the properties are observed. These results have been used to prepared CdS/CdTe/ZnTe:Cu solar cells. FF of 70.3% and efficiency of 13.38% have been demonstrated for 0.501cm2 cell
Keywords :
II-VI semiconductors; X-ray diffraction; cadmium compounds; carrier mobility; chemical vapour deposition; copper; optical constants; scanning electron microscopy; semiconductor growth; semiconductor thin films; solar cells; wide band gap semiconductors; zinc compounds; 13.38 percent; CSS process; CVD deposition; CdS-CdTe-ZnTe:Cu; Na2O-CaO-SiO2; SEM; XRD; carrier mobility; closed-space sublimation; electrical properties; fractional pressure; optical gap; optical properties; semiconductor thin films; soda lime glass substrate; solar cells; structural properties; Atmosphere; Cascading style sheets; Glass; Optical device fabrication; Optical films; Paper technology; Photovoltaic cells; Sputtering; Substrates; Transistors; CdTe thin films; closed-space sublimation; fractional pressure;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279501
