Title :
Junction electroluminescence of Cu(In,Ga)Se2 devices
Author :
Hernández, J.L. ; Rockett, A.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Abstract :
The electroluminescence of Cu(In,Ga)Se2 polycrystalline solar cells produced at different laboratories by different processes and with different Ga contents has been measured as a function of temperature and wavelength. The total emission intensity was found to have a power-law variation with the diode current with an exponent between 1.2 and 1.9. The external quantum efficiency of the electroluminescence was estimated to be between 10-6 and 10 -7 at room temperature and modest currents. This increases by up to two orders of magnitude at 70 K. A commercial light emitting diode (LED) was found to have an external quantum efficiency between 10-3 and 10-4 at roughly 103 higher current densities. Luminescence spectra were Gaussian. The peak luminescence wavelength of the solar cells increases upon cooling while the maximum wavelength for photocurrent generation decreases. The results suggest at least two independent processes for carrier generation and radiative recombination
Keywords :
copper compounds; electroluminescence; electron-hole recombination; indium compounds; light emitting diodes; minority carriers; p-n junctions; photoconductivity; solar cells; ternary semiconductors; Cu(In,Ga)Se2 polycrystalline solar cells; Cu(In,Ga)Se2 solar cells; Cu(InGa)Se2; Ga content; Gaussian luminescence spectra; LED; carrier generation; diode current; external quantum efficiency; junction electroluminescence; light emitting diode; peak luminescence wavelength; photocurrent generation; power-law variation; radiative recombination; temperature; total emission intensity; wavelength; Cooling; Current density; Electroluminescence; Laboratories; Light emitting diodes; Luminescence; Photovoltaic cells; Solar power generation; Temperature; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564292