• DocumentCode
    3198649
  • Title

    TCAD analysis of breakdown during voltage sweep in a carbon nanofiber (CNF) interconnect

  • Author

    Brunton, J. ; Yamada, T. ; Weatherford, T.

  • Author_Institution
    Code EC/WT, Naval Postgrad. Sch., Monterey, CA, USA
  • fYear
    2011
  • fDate
    16-20 Oct. 2011
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    Allotropes to graphene, carbon nanofibers (CNFs) are one of many potential materials for consideration in next generation devices. Because of their high thermal and electrical conductivity they are ideal for use as interconnects. The purpose of this work is to develop a technology computer-aided design (TCAD) device model to recreate the experiments by the Santa Clara University (SCU) [1] concerning the breakdown of CNF interconnect devices as shown in Figure 2. Regarding the modeling efforts, all existing models are 1D and static. To the best of the authors´ knowledge, this would be the first attempt to make a 2D model of a CNF structure and analyze joule heating breakdown. The simulation of the CNF records how the device heats and cools as the voltage increases. The experimental data used various structure configurations created in TCAD.
  • Keywords
    carbon fibres; electric breakdown; graphene; interconnections; nanofibres; polymorphism; technology CAD (electronics); TCAD analysis; allotropes to graphene; breakdown during voltage sweep; carbon nanofiber interconnect; carbon nanofibers; high thermal; next generation devices; Carbon; Current density; Electric breakdown; Heating; Materials; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
  • Conference_Location
    South Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4577-0113-9
  • Type

    conf

  • DOI
    10.1109/IIRW.2011.6142606
  • Filename
    6142606