DocumentCode
3198801
Title
Special interest group (SIG) summary: Plasma-Induced Damage (PID)
Author
Martin, Andreas
Author_Institution
Central reliability department, Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany
fYear
2011
fDate
16-20 Oct. 2011
Firstpage
156
Lastpage
157
Abstract
This special interest group discussed the topic “Plasma Induced Damage”. A questionnaire was distributed among the experts and the questionnaire results are reported in Table 1. This SIG summary reflects the group´s discussion results. Please note, that the order of topics reported here, follows the sequence of the discussion of the SIG. The order does not reflect the priority of the PID-topics. The significant results/decisions with common agreement are summarized in the conclusions.
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
Conference_Location
South Lake Tahoe, CA, USA
ISSN
1930-8841
Print_ISBN
978-1-4577-0113-9
Type
conf
DOI
10.1109/IIRW.2011.6142614
Filename
6142614
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