• DocumentCode
    3198801
  • Title

    Special interest group (SIG) summary: Plasma-Induced Damage (PID)

  • Author

    Martin, Andreas

  • Author_Institution
    Central reliability department, Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany
  • fYear
    2011
  • fDate
    16-20 Oct. 2011
  • Firstpage
    156
  • Lastpage
    157
  • Abstract
    This special interest group discussed the topic “Plasma Induced Damage”. A questionnaire was distributed among the experts and the questionnaire results are reported in Table 1. This SIG summary reflects the group´s discussion results. Please note, that the order of topics reported here, follows the sequence of the discussion of the SIG. The order does not reflect the priority of the PID-topics. The significant results/decisions with common agreement are summarized in the conclusions.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
  • Conference_Location
    South Lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4577-0113-9
  • Type

    conf

  • DOI
    10.1109/IIRW.2011.6142614
  • Filename
    6142614