Title :
Special interest group (SIG) summary: Plasma-Induced Damage (PID)
Author_Institution :
Central reliability department, Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany
Abstract :
This special interest group discussed the topic “Plasma Induced Damage”. A questionnaire was distributed among the experts and the questionnaire results are reported in Table 1. This SIG summary reflects the group´s discussion results. Please note, that the order of topics reported here, follows the sequence of the discussion of the SIG. The order does not reflect the priority of the PID-topics. The significant results/decisions with common agreement are summarized in the conclusions.
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
Print_ISBN :
978-1-4577-0113-9
DOI :
10.1109/IIRW.2011.6142614