DocumentCode :
3198801
Title :
Special interest group (SIG) summary: Plasma-Induced Damage (PID)
Author :
Martin, Andreas
Author_Institution :
Central reliability department, Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany
fYear :
2011
fDate :
16-20 Oct. 2011
Firstpage :
156
Lastpage :
157
Abstract :
This special interest group discussed the topic “Plasma Induced Damage”. A questionnaire was distributed among the experts and the questionnaire results are reported in Table 1. This SIG summary reflects the group´s discussion results. Please note, that the order of topics reported here, follows the sequence of the discussion of the SIG. The order does not reflect the priority of the PID-topics. The significant results/decisions with common agreement are summarized in the conclusions.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International
Conference_Location :
South Lake Tahoe, CA, USA
ISSN :
1930-8841
Print_ISBN :
978-1-4577-0113-9
Type :
conf
DOI :
10.1109/IIRW.2011.6142614
Filename :
6142614
Link To Document :
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