• DocumentCode
    3199051
  • Title

    Development of charged particle detectors by integrating gas amplification stages and CMOS ASICS on wafer level

  • Author

    Kaminski, Jochen ; Baumgartner, Tobias ; Desch, Klaus ; Ehrmann, Oswin ; Fritzsch, Thomas ; Krautscheid, Thorsten ; Mayer, Stefan ; Töpper, Michael

  • Author_Institution
    Univ. of Bonn, Bonn, Germany
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Gaseous detectors with a highly pixelized readout have demonstrated good capabilities of tracking high energetic particles. In particular, using post-processing methods to integrate the gas amplification stage on top of pixel readout chips has proven to detect single electrons with a very high efficiency and accuracy. So far, these detectors called InGrids or GEMGrids have been produced in a chip based process at the University of Twente. A new wafer based production process has been set up. A first test sample has been produced and tested. Signals from a β as well as from a γ source could be observed.
  • Keywords
    CMOS analogue integrated circuits; application specific integrated circuits; gas scintillation detectors; nuclear electronics; position sensitive particle detectors; readout electronics; wafer-scale integration; CMOS ASICs; GEMGrid detectors; InGrid detectors; charged particle detectors; gas amplification stage; gaseous detectors; high energetic particle tracking; pixelized readout; wafer based production process; Dielectrics; Electric breakdown; Electrodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642941
  • Filename
    5642941