DocumentCode
3199229
Title
Stroke-length control of a MEMS device
Author
Wang, L. ; Dawson, J.M. ; Chen, J. ; Famouri, P. ; Hornak, L.A.
Author_Institution
Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
535
Abstract
Microelectromechanical systems (MEMS) have a variety of potential civil and military applications. As MEMS become widely implemented, the application of closed-loop control methods to MEMS will lead to higher degrees of certainty and reliability of microelectromechanical operation in physically demanding environments. This paper presents an overview of research and development progress in the area of MEMS control at West Virginia University. The implementation and simulation of a closed-loop stroke-length control of a lateral comb actuator is presented. The closed-loop scheme implemented is based on a common proportional, integral, derivative (PID) linear feedback control. The position signal of the lateral comb actuator device was obtained using a through-wafer free-space optical probe. The paper also includes further progress in both linear and nonlinear feedback position control schemes
Keywords
closed loop systems; feedback; microactuators; motion control; three-term control; PID linear feedback control; West Virginia University; civil applications; closed-loop control methods; closed-loop stroke-length control; lateral comb actuator; linear feedback position control; microelectromechanical systems; military applications; nonlinear feedback position control; physically demanding environments; position signal; reliability; research and development; stroke-length control; through-wafer free-space optical probe; Actuators; Feedback control; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Nonlinear optical devices; Nonlinear optics; Optical feedback; Research and development; Three-term control;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2000. ISIE 2000. Proceedings of the 2000 IEEE International Symposium on
Conference_Location
Cholula, Puebla
Print_ISBN
0-7803-6606-9
Type
conf
DOI
10.1109/ISIE.2000.930354
Filename
930354
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