Title :
Built-in Current Sensor for High Speed Transient Current Testing in Analog CMOS Circuits
Author :
Yellampalli, Siva ; Korivi, N.S. ; Marulanda, J.
Author_Institution :
Louisiana State Univ., Baton Rouge
Abstract :
In this paper, we present a new built-in current sensor (BICS) for high speed, low voltage degradation transient current (IDDT) testing. This sensor has been designed using forward bias technique to limit the supply voltage degradation caused during transient current peaks to 2% of the supply voltage. A CMOS operational amplifier designed for operation at plusmn2.5 V in 0.5 mum n-well CMOS process is used as the circuit under test (CUT). The faults simulating possible short and bridging defects are introduced using the fault injection transistors (FIT). A total of twenty short faults have been introduced into the CUT and nineteen of them were detected, giving 95% fault coverage.
Keywords :
CMOS analogue integrated circuits; built-in self test; fault simulation; integrated circuit testing; operational amplifiers; power supply circuits; CMOS operational amplifier; CMOS process; analog CMOS circuits; built-in current sensor; circuit under test; fault injection transistors; fault simulation; forward bias technique; high speed transient current testing; low voltage degradation transient current testing; supply voltage degradation; CMOS analog integrated circuits; CMOS process; Circuit faults; Circuit simulation; Circuit testing; Degradation; Electrical fault detection; Fault detection; Low voltage; Operational amplifiers; Built-In Current Sensor; Forward Biasing; Low Voltage Degradation; Transient Current Testing;
Conference_Titel :
System Theory, 2008. SSST 2008. 40th Southeastern Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-1806-0
Electronic_ISBN :
0094-2898
DOI :
10.1109/SSST.2008.4480227
