• DocumentCode
    3199343
  • Title

    Electrical evaluation of wafer level fan out (WLFO) package using organic substrates for microwave applications

  • Author

    Lee, SeungJae ; Kim, SangWon ; Kim, Gawon ; Bae, KiCheol ; Yu, Jiheon ; Kim, JinYoung ; Yoo, HeeYeoul ; Lee, ChoonHeung

  • Author_Institution
    Amkor Technol. Korea, South Korea
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, developments of wafer level fan-out (WLFO) technology using organic substrates, ajinomoto build-up film (ABF) with laser ablation process and buried pattern PCB, are introduced for low cost and high electrical performance not only on low frequency ranges but also microwave applications. WLFO technology using organic substrates can enhance routing density and provide smaller form factor than flip-chip chip scale packages (fcCSP). Moreover, short signal routing paths from die out to package out can be realized to improve overall electrical performance in WLFO, In this paper, the process of WLFO using ABF with laser drilling and buried-pattern PCB substrate are explained. In addition, measurements of coplanar waveguide (CPW) structure on WLFO and interconnection models from die I/O pad to balls using 3D EM simulation are conducted to estimate effectiveness in microwave ranges.
  • Keywords
    buried layers; coplanar waveguides; integrated circuit interconnections; laser ablation; wafer level packaging; 3D electromagnetic simulation; CPW; ajinomoto build-up film; buried-pattern PCB substrate; coplanar waveguide structure; die I/O pad; die out-package out; interconnection models; laser ablation; laser drilling; microwave applications; organic substrates; routing density; short signal routing paths; wafer level fan out package; Coplanar waveguides; Lithography; Plasmas; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642956
  • Filename
    5642956