DocumentCode
3199470
Title
Passive parametric modeling of interconnects and packaging components from sampled impedance, admittance or scattering data
Author
Triverio, Piero ; Nakhla, Michel ; Grivet-Talocia, Stefano
Author_Institution
Politec. di Torino, Torino, Italy
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
6
Abstract
We present a methodology to generate passive parametric macromodels from impedance, admittance or scattering samples. The key features of the proposed approach are two. First, the proposed model is passive by construction over the entire parameter range, and will therefore lead to stable time-domain simulations. Second, the model poles are fully parameterized. This latter feature enables a high fitting accuracy and a reduced model complexity. Two application examples compare the performance of this technique with the state of the art.
Keywords
electric admittance; electric impedance; electronics packaging; integrated circuit interconnections; time-domain analysis; admittance; impedance; interconnects; packaging components; passive parametric modeling; scattering data; time-domain simulations; Computational modeling; Impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location
Berlin
Print_ISBN
978-1-4244-8553-6
Electronic_ISBN
978-1-4244-8554-3
Type
conf
DOI
10.1109/ESTC.2010.5642961
Filename
5642961
Link To Document