• DocumentCode
    3199470
  • Title

    Passive parametric modeling of interconnects and packaging components from sampled impedance, admittance or scattering data

  • Author

    Triverio, Piero ; Nakhla, Michel ; Grivet-Talocia, Stefano

  • Author_Institution
    Politec. di Torino, Torino, Italy
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We present a methodology to generate passive parametric macromodels from impedance, admittance or scattering samples. The key features of the proposed approach are two. First, the proposed model is passive by construction over the entire parameter range, and will therefore lead to stable time-domain simulations. Second, the model poles are fully parameterized. This latter feature enables a high fitting accuracy and a reduced model complexity. Two application examples compare the performance of this technique with the state of the art.
  • Keywords
    electric admittance; electric impedance; electronics packaging; integrated circuit interconnections; time-domain analysis; admittance; impedance; interconnects; packaging components; passive parametric modeling; scattering data; time-domain simulations; Computational modeling; Impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642961
  • Filename
    5642961