DocumentCode :
3199470
Title :
Passive parametric modeling of interconnects and packaging components from sampled impedance, admittance or scattering data
Author :
Triverio, Piero ; Nakhla, Michel ; Grivet-Talocia, Stefano
Author_Institution :
Politec. di Torino, Torino, Italy
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
We present a methodology to generate passive parametric macromodels from impedance, admittance or scattering samples. The key features of the proposed approach are two. First, the proposed model is passive by construction over the entire parameter range, and will therefore lead to stable time-domain simulations. Second, the model poles are fully parameterized. This latter feature enables a high fitting accuracy and a reduced model complexity. Two application examples compare the performance of this technique with the state of the art.
Keywords :
electric admittance; electric impedance; electronics packaging; integrated circuit interconnections; time-domain analysis; admittance; impedance; interconnects; packaging components; passive parametric modeling; scattering data; time-domain simulations; Computational modeling; Impedance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642961
Filename :
5642961
Link To Document :
بازگشت