Title :
Planning of truncated sequential binomial tests via the ASN-increase parameter
Author :
Michlin, Yefim Haim ; Shaham, Ofer
Author_Institution :
Fac. of Ind. Eng. & Manage., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
The sequential probability ratio test (SPRT) is the most common acceptance test in the field of reliability and quality control of electronic systems. Proposed are measures of the test quality. One of them is the increase in the average sample number (ASN) caused by the test truncation. An optimality criterion based on it considerably facilitates solution of the problems in automatic planning of the test. Also given are formulas for determining one of the parameters of the test boundaries - the truncation apex (TA), depending on the required test characteristics. A user´s algorithm for the planner is also included.
Keywords :
integrated circuit reliability; integrated circuit testing; probability; quality control; sampling methods; ASN-increase parameter; average sample number; electronic systems; quality control; reliability; sequential probability ratio test; truncated sequential binomial tests; truncation apex; Electronic equipment testing; Engineering management; Industrial engineering; Industrial relations; Microelectronics; Quality control; Sequential analysis; System testing; Technology management; Technology planning; Binomial test; reliability; sequential testing; test truncation;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4244-3985-0
DOI :
10.1109/COMCAS.2009.5386017
