Planning of truncated sequential binomial tests via the ASN-increase parameter

Author

Michlin, Yefim Haim ; Shaham, Ofer

Author_Institution

Fac. of Ind. Eng. & Manage., Technion - Israel Inst. of Technol., Haifa, Israel

fYear

2009

fDate

9-11 Nov. 2009

Firstpage

1

Lastpage

5

Abstract

The sequential probability ratio test (SPRT) is the most common acceptance test in the field of reliability and quality control of electronic systems. Proposed are measures of the test quality. One of them is the increase in the average sample number (ASN) caused by the test truncation. An optimality criterion based on it considerably facilitates solution of the problems in automatic planning of the test. Also given are formulas for determining one of the parameters of the test boundaries - the truncation apex (TA), depending on the required test characteristics. A user´s algorithm for the planner is also included.

Keywords

integrated circuit reliability; integrated circuit testing; probability; quality control; sampling methods; ASN-increase parameter; average sample number; electronic systems; quality control; reliability; sequential probability ratio test; truncated sequential binomial tests; truncation apex; Electronic equipment testing; Engineering management; Industrial engineering; Industrial relations; Microelectronics; Quality control; Sequential analysis; System testing; Technology management; Technology planning; Binomial test; reliability; sequential testing; test truncation;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on

Conference_Location

Tel Aviv

Print_ISBN

978-1-4244-3985-0

Type

conf

DOI

10.1109/COMCAS.2009.5386017

Filename

5386017