Title :
Robust classification of DNA damage patterns in single cell gel electrophoresis
Author :
Taehoon Lee ; Sungmin Lee ; Woo Young Sim ; Yu Mi Jung ; Sunmi Han ; Chanil Chung ; Chang, Jen-Yuan James ; Hyeyoung Min ; Sungroh Yoon
Author_Institution :
Dept. of Electr. & Comput. Eng., Seoul Nat. Univ., Seoul, South Korea
Abstract :
Single cell gel electrophoresis, also known as comet assay, has been widely used for assessing the effect of genotoxicity and detecting DNA damage of individual eukaryotic cells. There exist established imaging techniques for cometassay analysis, but these platforms have limitations such as required user interventions, low throughput, and weakness to noise caused by incomplete dyeing of fluorescent materials and other experimental errors. To resolve these, we propose a novel procedure for analyzing comet assay images, which considers various DNA damage patterns and classifies them in a robust manner. We tested our approach with twenty golden data sets containing over 300 comets and achieved satisfactory classification accuracy.
Keywords :
DNA; biomedical imaging; cellular biophysics; electrophoresis; gels; molecular biophysics; pattern classification; DNA damage detectiohn; DNA damage pattern classification; comet assay image analysis; dye; eukaryotic cell; experimental error; fluorescent material; genotoxicity effect assessment; imaging technique; single cell gel electrophoresis; user intervention; Accuracy; DNA; Head; Image color analysis; Image edge detection; Materials; Shape;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6610338