Reducing Atomic Force Microscope Tip Deflection using Command Shaping

Dynamic atomic force microscopy (AFM) is a popular scanning method that utilizes an oscillating cantilever tip to interact with and develop high resolution images of surfaces. Though this method is one of the most versatile in AFM, it is dependent upon maintaining constant oscillation amplitude. Constant oscillation amplitude can be difficult to achieve when probe movement is necessary to maintain an appropriate tip to sample distance. This paper documents the effectiveness of command shaping techniques in reducing the probe´s tip deflection during the scanning process. Command shapers are used to modify the movements of the scanning probe base in response to changes in the sample´s surface. Reducing tip deflection and tip tracking error improve the quality of the scanned image while reducing the likelihood of damage to the sample or the probe.