DocumentCode
3199694
Title
Investigation into the impact of component floor plan layout on the overall reliability of electronics systems in harsh environments
Author
Braden, Derek R. ; Yang, Ryan S H ; Duralek, Janusz ; Zhang, Guang-Ming ; Harvey, David M.
Author_Institution
Delphi Electron. Group, Kirkby, UK
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
6
Abstract
For many harsh environment, high reliability product applications such as automotive, military and avionics, the solder joint fatigue behaviour of electronic packages subjected to accelerated thermal cycling is frequently used as an estimate of `in field´ reliability. Although the fatigue response of the individual package interconnect styles is understood in terms of material sets used and CTE differences between component and board, the influence of component location on the Printed Circuit Board (PCB) floor plan or PCB constraint points has not previously been investigated. This paper outlines preliminary investigatory work undertaken using Finite Element Modelling (FEM) to study such influences on the performance and behaviour of solder joints.
Keywords
circuit reliability; electronics packaging; fatigue; finite element analysis; printed circuit layout; printed circuits; solders; thermal expansion; FEM; PCB constraint points; accelerated thermal cycling; component floor plan layout; electronic packages; electronics systems; finite element modelling; harsh environments; in-field reliability; package interconnect styles; printed circuit board; solder joint fatigue; thermal expansion coefficient; Finite element methods; Lead; Reliability engineering; Substrates; Warranties;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location
Berlin
Print_ISBN
978-1-4244-8553-6
Electronic_ISBN
978-1-4244-8554-3
Type
conf
DOI
10.1109/ESTC.2010.5642969
Filename
5642969
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