• DocumentCode
    3199790
  • Title

    Use of time domain methods for CISPR16 compliant EMI measurements

  • Author

    Westenberger, Heinz

  • Author_Institution
    Rohde & Schwarz Int. Oper. GmbH, Munich, Germany
  • fYear
    2009
  • fDate
    9-11 Nov. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A common problem with EMI measurements using conventional time-saving procedures is that in most cases the total measurement time is still very long (e.g. in the order of hours). A significant reduction of the measurement time is possible when using time-domain methods that determine the interfering spectrum by means of the digital fast Fourier transform. But when performing measurements of an unknown combination of narrowband and broadband EMI signals with a broadband time-domain EMI (TDEMI) measurement system special problems has to be considered and measures to be taken to be in line with CISPR 16. The paper starts with a general description of the TDEMI system followed by an explanation of the major problems and how they are solved without missing any inferring signal or without losses in accuracy. An example introducing an EMI measuring system consisting of a compliant test receiver enhanced by fast Fourier transform (FFT) to reduce the measurement time by a factor of up to 590 concludes the presentation.
  • Keywords
    fast Fourier transforms; radiofrequency interference; radiofrequency measurement; time-domain analysis; CISPR16 compliant EMI measurement; FFT; TDEMI system; broadband time-domain EMI measurement system; compliant test receiver; digital fast Fourier transform; inferring signal; interfering spectrum; total measurement time reduction; Bandwidth; Electromagnetic interference; Fast Fourier transforms; Frequency measurement; Narrowband; Performance evaluation; Signal resolution; Testing; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
  • Conference_Location
    Tel Aviv
  • Print_ISBN
    978-1-4244-3985-0
  • Type

    conf

  • DOI
    10.1109/COMCAS.2009.5386027
  • Filename
    5386027