Title :
Numerical diffraction coefficients for the conductor-backed dielectric half-plane
Author :
Moore, J. ; Ling Hao
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
A method is presented for extracting the numerical diffraction coefficients for coated edges and material joints. Without resorting to an IBC approximation, an exact boundary integral formulation of the coated edge is used as the basis of numerical coefficient extraction. The semi-infinite problem is solved by taking into account the nondecaying physical optics and surface wave fields such that the final discretization domain involves only a finite region near the diffraction center. Numerical diffraction coefficients are extracted and then employed within a uniform theory of diffraction framework to construct solutions to finite-sized coated structures. Agreement between the solution and an exact moment method solution for the finite coated structures suggests that this method is a viable approach to the detailed study of the complex scattering physics occurring in coated structures.<>
Keywords :
boundary-value problems; conductors (electric); electromagnetic wave diffraction; electromagnetic wave scattering; integral equations; coated edge; conductor-backed dielectric half-plane; exact boundary integral; exact moment method solution; finite-sized coated structures; nondecaying physical optics; numerical diffraction coefficients; scattering physics; surface wave fields; uniform theory of diffraction; Conducting materials; Integral equations; Joining materials; Moment methods; Optical diffraction; Optical materials; Optical surface waves; Physical optics; Physical theory of diffraction; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221938