Title :
On the probabilistic characterization of model uncertainty and robustness
Author :
Chen, Xinjia ; Zhou, Kemin
Author_Institution :
Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
Abstract :
This paper considers the probabilistic characterization of model uncertainties and stability robustness on the Nyquist diagram. For any given ε>0, any frequency ω, we describe the boundary of a domain Dε,ω such that the frequency response of an uncertain plant at that frequency ω is guaranteed in the domain with a probability of at least 1-ε where ε⩽ε is a function of ε and frequency ω and a upper bound of ε can be estimated easily. Then, by analyzing the evolution of the boundary of Dε,ω as a function of the frequency ω, a combined curve C is constructed such that it includes the boundary of a domain Dε covering the Nyquist plot with a probability of at least 1-ε for a range of frequencies
Keywords :
Nyquist diagrams; control system analysis; control system synthesis; frequency response; probability; robust control; uncertain systems; Nyquist diagram; Nyquist plot; boundary evolution; combined curve; frequency response; model uncertainty; probabilistic characterization; robustness; stability robustness; uncertain plant; Control system synthesis; Frequency estimation; Frequency response; Monte Carlo methods; Probability distribution; Robust control; Robust stability; Robustness; Uncertain systems; Uncertainty;
Conference_Titel :
Decision and Control, 1997., Proceedings of the 36th IEEE Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4187-2
DOI :
10.1109/CDC.1997.652455