DocumentCode
3200231
Title
Measurement of uniaxial anisotropy in Rogers RO3010 substrate material
Author
Rautio, James C.
Author_Institution
Sonnet Software, Inc., North Syracuse, NY, USA
fYear
2009
fDate
9-11 Nov. 2009
Firstpage
1
Lastpage
4
Abstract
A new technique using a dual mode ¿RA resonator¿ to measure uniaxial anisotropy in planar substrates is applied to Rogers RO3010 material. When this technique was previously applied to FR-4, an unexpected result (a horizontal dielectric constant less than the vertical dielectric constant) was obtained. It is hypothesized that the unexpected result is due to the fact that FR-4 is inhomogeneous. For example the glass fiber weave embedded in the FR-4 epoxy is not uniformly distributed. To test this hypothesis, similar measurements are performed on Rogers RO3010 material, which is strongly anisotropic, perfectly homogeneous, and is known from independent measurements to have a horizontal dielectric constant greater than the vertical. Several modifications to the original RA resonator that increase the frequency range over which useful measurements can be acquired are described and demonstrated.
Keywords
dielectric resonators; glass fibre reinforced composites; microstrip resonators; permittivity; permittivity measurement; resins; FR-4 epoxy; Rogers RO3010 substrate material; coupled line resonator; dual mode RA resonator; dual mode microstrip resonator; glass fiber weave; horizontal dielectric constant; stripline resonator; uniaxial anisotropy measurement; vertical dielectric constant; Anisotropic magnetoresistance; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Glass; Materials testing; Optical fiber testing; Performance evaluation; Anisotropy; dielectric constant; dispersion; electromagnetic analysis; method-of-Moments (MoM); printed circuit board (PCB); transmission line; uniaxial;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
Conference_Location
Tel Aviv
Print_ISBN
978-1-4244-3985-0
Type
conf
DOI
10.1109/COMCAS.2009.5386053
Filename
5386053
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