DocumentCode :
3200431
Title :
Characterization methods for determination of temperature depended electrical, thermal, mechanical and fatigue properties of SnAg3.5 solder
Author :
Roellig, Mike ; Metasch, Rene ; Meier, Karsten ; Alt, Florian
Author_Institution :
Fraunhofer Inst. for Non-Destruct. Testing (IZFP-D), Dresden, Germany
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
11
Abstract :
The application of solder joints for electrical and mechanical interconnections between two functional layers in electronic packages will be present in future devices, even in 3D-electronic devices. Very different approaches are investigated such as copper pillar, full inter-metallic joints or Au-Sn nanosponge. But the interconnection realization by μ-solder bumps as well as Flip-Chip solder joints will be one high potential connection method. The fundamentals about the solder alloy properties are necessary for material selection at product planning phase and further for the reliability estimations. Modern simulation tools are used for weak point estimations as well as for lifetime estimations (e.g. FEM). Any simulation software demands martial properties. The paper presents an excerpt of characterization techniques and results for the following physical data of SnAg3.5 solder: (1) Elastic modulus (2) Poisson ratio (3) Creep (4) Lin. thermal expansion (CTE) (5) Thermal conductivity (6) Electrical conductivity (7) Fatigue.
Keywords :
Poisson ratio; electronics packaging; finite element analysis; flip-chip devices; solders; tin alloys; μ-solder bumps; Au-Sn; FEM; Poisson ratio; SnAg3.5; elastic modulus; electrical conductivity; electrical interconnections; electrical properties; electronic packages; fatigue properties; flip-chip solder joints; material selection; mechanical interconnections; mechanical properties; reliability estimations; solder alloy properties; thermal conductivity; thermal properties; Copper; Creep; Displacement measurement; Fatigue; Joints; Through-silicon vias; Variable speed drives;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5643005
Filename :
5643005
Link To Document :
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