DocumentCode :
3200465
Title :
Design Approaches and Materials Processes for Ultrahigh Efficiency Lattice Mismatched Multi-Junction Solar Cells
Author :
Griggs, Melissa J. ; Law, Daniel C. ; King, Richard R. ; Ackerman, Arthur C. ; Zahler, James M. ; Atwater, Harry A.
Author_Institution :
California Inst. of Technol., Pasadena, CA
Volume :
1
fYear :
2006
fDate :
38838
Firstpage :
857
Lastpage :
860
Abstract :
In this study, we report synthesis of large area (gt;2cm2 ), crack-free GaAs and GaInP double heterostructures grown in a multi-junction solar cell-like structure by MOCVD. Initial solar cell data are also reported for GaInP top cells. These samples were grown on Ge/Si templates fabricated using wafer bonding and ion implantation induced layer transfer techniques. The double heterostructures exhibit radiative emission with uniform intensity and wavelength in regions not containing interfacial bubble defects. The minority carrier lifetime of ~1ns was estimated from photoluminescence decay measurements in both double heterostructures. We also report on the structural characteristics of heterostructures, determined via atomic force microscopy and transmission electron microscopy, and correlate these characteristics to the spatial variation of the minority carrier lifetime
Keywords :
III-V semiconductors; MOCVD; atomic force microscopy; carrier lifetime; elemental semiconductors; gallium arsenide; gallium compounds; germanium; indium compounds; ion implantation; minority carriers; photoluminescence; semiconductor epitaxial layers; semiconductor growth; semiconductor heterojunctions; silicon; solar cells; wafer bonding; GaAs-GaInP; Ge-Si; Ge-Si templates; MOCVD; atomic force microscopy; crack-free semiconductor double heterostructures; design approaches; interfacial bubble defects; ion implantation induced layer transfer; material processes; minority carrier lifetime; photoluminescence decay measurements; radiative emission; semiconductor top cells; spatial variation; structural characteristics; transmission electron microscopy; ultrahigh efficiency lattice mismatched multijunction solar cell-like structure; uniform intensity; uniform wavelength; wafer bonding; Atomic force microscopy; Charge carrier lifetime; Gallium arsenide; Ion implantation; Lattices; Life estimation; MOCVD; Photovoltaic cells; Transmission electron microscopy; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
Type :
conf
DOI :
10.1109/WCPEC.2006.279592
Filename :
4059765
Link To Document :
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