Title :
Attenuated Total Reflectance (ATR)-FTIR spectral measurements in MIR and FIR (THz) range
Author :
Shulzinger, A. ; Abramovich, A. ; Farber, E.
Author_Institution :
Dept. of Electr. & Electron. Eng., Ariel Univ. Center of Samaria, Ariel, Israel
Abstract :
Mid-Infrared (MIR) spectroscopy is an extremely reliable and well recognized fingerprinting method. Far-Infrared (FIR) and THz spectroscopy is quite difficult since it requires special sources, quasi optics, special materials and sensitive detectors. The technique of Attenuated Total Reflectance (ATR) has in recent years revolutionized solid and liquid sample analyses because it combats the most challenging aspects of infrared analyses, namely sample preparation and spectral reproducibility. An attenuated total reflection accessory operates by measuring the changes that occur in a totally internally reflected infrared beam when the beam comes into contact with a sample. In this work a spectral measurements using the ATR-FTIR technique will be presented. Spectral measurements of liquids and powders in the THz regime will be discussed and analyze. Furthermore, we will present ATR-FTIR spectral measurements that were carried out for commercial companies.
Keywords :
Fourier transform spectra; Fourier transform spectroscopy; attenuated total reflection; infrared spectra; infrared spectroscopy; liquids; terahertz spectroscopy; terahertz wave spectra; ATR-FTIR spectral measurement; FTIR spectra; THz spectroscopy; attenuated total reflectance spectra; far-infrared spectroscopy; fingerprinting; liquids; mid-infrared spectroscopy; powders; totally internally reflected infrared beam; Attenuation measurement; Fingerprint recognition; Finite impulse response filter; Optical attenuators; Optical materials; Optical sensors; Reflectivity; Solids; Spectroscopy; Ultraviolet sources; Terahertz; attenuated total reflection; infrared; measurements; spectra; spectroscopy;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4244-3985-0
DOI :
10.1109/COMCAS.2009.5386070