• DocumentCode
    3200626
  • Title

    Experimental investigation of open-ended microwave oven assisted encapsulation process

  • Author

    Pavuluri, S.K. ; Ferenets, M. ; Goussetis, G. ; Desmulliez, M.P.Y. ; Tilford, T. ; Adamietz, R. ; Muller, G. ; Eicher, F. ; Bailey, C.

  • Author_Institution
    Microsyst. Eng. Centre (MISEC), Heriot-Watt Univ., Edinburgh, UK
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An open ended microwave oven is presented with improved uniform heating, heating rates and power conversion efficiency. This next generation oven produces more uniform EM fields in the evanescent region forming part of the heating area of the oven. These fields are vital for the rapid and uniform heating of various electromagnetically lossy materials. A fibre optic temperature sensor and an IR pyrometer are used to measure in situ and in real-time the temperature of the curing materials. An automatic computer controlled closed feedback loop measures the temperature in the curing material and drives the microwave components to obtain predetermined curing temperature cycles for efficient curing. Uniform curing of the lossy encapsulants is achieved with this oven with typical cure cycle of 270 seconds with a ramp rate of 1°C/s and a hold period of 2 minutes. Differential scanning calorimeter based measurement for the pulsed microwave based curing of the polymer dielectric indicates a ~ 100% degree of cure.
  • Keywords
    encapsulation; fibre optic sensors; microwave ovens; pyrometers; temperature measurement; temperature sensors; EM fields; IR pyrometer; assisted encapsulation process; automatic computer controlled closed feedback loop; curing material; curing temperature cycles; differential scanning calorimeter; electromagnetic lossy materials; evanescent region forming; microwave components; open ended microwave oven; polymer dielectric; power conversion efficiency; time 270 s; Apertures; Electromagnetic heating; Polymers; Substrates; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5643015
  • Filename
    5643015