DocumentCode
3200626
Title
Experimental investigation of open-ended microwave oven assisted encapsulation process
Author
Pavuluri, S.K. ; Ferenets, M. ; Goussetis, G. ; Desmulliez, M.P.Y. ; Tilford, T. ; Adamietz, R. ; Muller, G. ; Eicher, F. ; Bailey, C.
Author_Institution
Microsyst. Eng. Centre (MISEC), Heriot-Watt Univ., Edinburgh, UK
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
6
Abstract
An open ended microwave oven is presented with improved uniform heating, heating rates and power conversion efficiency. This next generation oven produces more uniform EM fields in the evanescent region forming part of the heating area of the oven. These fields are vital for the rapid and uniform heating of various electromagnetically lossy materials. A fibre optic temperature sensor and an IR pyrometer are used to measure in situ and in real-time the temperature of the curing materials. An automatic computer controlled closed feedback loop measures the temperature in the curing material and drives the microwave components to obtain predetermined curing temperature cycles for efficient curing. Uniform curing of the lossy encapsulants is achieved with this oven with typical cure cycle of 270 seconds with a ramp rate of 1°C/s and a hold period of 2 minutes. Differential scanning calorimeter based measurement for the pulsed microwave based curing of the polymer dielectric indicates a ~ 100% degree of cure.
Keywords
encapsulation; fibre optic sensors; microwave ovens; pyrometers; temperature measurement; temperature sensors; EM fields; IR pyrometer; assisted encapsulation process; automatic computer controlled closed feedback loop; curing material; curing temperature cycles; differential scanning calorimeter; electromagnetic lossy materials; evanescent region forming; microwave components; open ended microwave oven; polymer dielectric; power conversion efficiency; time 270 s; Apertures; Electromagnetic heating; Polymers; Substrates; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location
Berlin
Print_ISBN
978-1-4244-8553-6
Electronic_ISBN
978-1-4244-8554-3
Type
conf
DOI
10.1109/ESTC.2010.5643015
Filename
5643015
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