• DocumentCode
    3200667
  • Title

    A hybrid wafer level packaging technique for multi-chip interconnect using low loss organic layers

  • Author

    Bhattacharya, Swapan K. ; Chung, David J. ; Zhang, Yiwen ; Chen, James ; Papapolymerou, John

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2009
  • fDate
    9-11 Nov. 2009
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper presents a new wafer level packaging (WLP) technique that combines thin, low cost organic layers with high performance MMICs. More specifically, we present a GaAs-based single stage amplifier covered with layers of a low loss liquid crystal polymer organic material. It was observed that the RF performance of the MMIC is virtually unaffected by this technique unlike conventional packaging processes that degrade the RF performance due to the overlay of the dielectric material on the MMIC. The insertion loss for the laser ablated 50 micron vias was minimal up to 20 GHz. These results show that the hybrid WLP can be successfully implemented with virtually no performance degradation.
  • Keywords
    III-V semiconductors; MMIC amplifiers; dielectric materials; gallium arsenide; integrated circuit interconnections; laser ablation; liquid crystal polymers; wafer level packaging; GaAs; MMICs; dielectric material; hybrid wafer level packaging technique; insertion loss; laser ablated vias; liquid crystal polymer; low loss organic layers; multichip interconnect; packaging process; single stage amplifier; wavelength 50 mum; Costs; Dielectric materials; Liquid crystal polymers; MMICs; Organic materials; Packaging; Radio frequency; Radiofrequency amplifiers; Thermal degradation; Wafer scale integration; Embedded chip; LCP process; embedded circuitry; via characterization; wafer level packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Communications, Antennas and Electronics Systems, 2009. COMCAS 2009. IEEE International Conference on
  • Conference_Location
    Tel Aviv
  • Print_ISBN
    978-1-4244-3985-0
  • Type

    conf

  • DOI
    10.1109/COMCAS.2009.5386075
  • Filename
    5386075