Title :
Thin die - Novel process for stack die packages and yield optimization
Author :
Stöckli, Thomas ; Rodríguez, Irving ; Ernst, Urban ; Harnisch, Oliver
Abstract :
Stacking dice using die attach films is a very common approach to pack more and more memory and functionalities into the same foot print area. Devices with up to eight 35 μm thick electronic components stacked using 30 μm thick die attach materials are in mass production today. The next generation devices target die thicknesses of 25 μm and even 15 μm to be stacked using 5 μm thick adhesive layers. Picking and placing these types of ultra thin dies from the wafer mounting tape is extremely difficult. There are 3 areas to explore in order to improve the die bonding productivity for these ultra thin die. The equipment design, the method of picking, and the process used for placing the die. In this contribution a novel die bonder which picks and places a die in parallel allowing for reduction in the overall cycle time is discussed. The die attach process is investigated in detail and methods to improve throughput while maintaining quality are presented.
Keywords :
electronics packaging; microassembling; die attach films; die attach process; die bonding productivity; mass production; size 15 mum; size 25 mum; size 30 mum; size 35 mum; size 5 mum; stack die packages; thick die attach materials; ultra thin dies; yield optimization; Adhesives; Films; Force; Microassembly; Optimization; Substrates;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5643019