• DocumentCode
    3200804
  • Title

    A New Approach to Prevent the Negative Impact of the Metastable Defect in Boron Doped CZ Silicon Solar Cells

  • Author

    Herguth, Axel ; Schubert, Gunnar ; Kaes, Martin ; Hahn, Giso

  • Author_Institution
    Dept. of Phys., Konstanz Univ.
  • Volume
    1
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    940
  • Lastpage
    943
  • Abstract
    A new reaction model concerning the boron-oxygen related degradation is presented, introducing a third recombination inactive state, that stabilizes the electrical parameters of Cz-Si solar cells, and the transition to this new inactive state is proven by experimental data. Furthermore, the stability under solar cell working conditions and the formation kinetics of this additional state are discussed
  • Keywords
    boron; elemental semiconductors; oxygen; semiconductor device models; silicon; solar cells; Si:B,O; boron doped CZ silicon solar cells; boron-oxygen related degradation; electrical parameters; formation kinetics; inactive state transition; metastable defect; negative impact; reaction model; third recombination inactive state; Annealing; Boron; Degradation; Frequency; Kinetic theory; Metastasis; Photovoltaic cells; Silicon; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279611
  • Filename
    4059784