DocumentCode
3201007
Title
Intracellular DNA breakage in CHO cells induced by exposure to intense burst sinusoidal electric fields
Author
Yano, M. ; Nomura, N. ; Morotomi, K. ; Yano, K. ; Katsuki, S. ; Akiyama, H.
Author_Institution
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
fYear
2009
fDate
June 28 2009-July 2 2009
Firstpage
1004
Lastpage
1007
Abstract
Intracellular DNA breakage induced by exposing to non-thermal, intense burst sinusoidal electric fields (IBSEF) was studied by means of alkaline comet assay, single cell electrophoresis. The IBSEFs with frequency in the range of 300 kHz-100 MHz and with field strength up to 200 kV/m were applied to cultured Chinese hamster ovary (CHO) cells. The DNA breakage indicated by the comet pattern was evaluated by using Olive Moment Method. The experiment shows that the DNA breakage depends both on the field strength and on the frequency of the IBSEF. For the frequency of 100 MHz, the critical field strength is 10 kV/m. For the strength of 100 kV/m, the DNA is damaged only with the frequency exceeding 1 MHz. Two dimensional calculation of the electric field distribution under an alternating field implies that the DNA breakage occurs only when the intracellular electric field exceeds 30 kV/m, which might trigger biological processes leading to the DNA breakage.
Keywords
DNA; bioelectric phenomena; biological effects of fields; biological techniques; biomolecular effects of radiation; cellular biophysics; CHO cells; Chinese hamster ovary cells; IBSEF frequency; Olive moment method; alkaline comet assay; electric field strength; frequency 300 kHz to 100 MHz; intense burst sinusoidal electric fields; intracellular DNA breakage; nonthermal electric fields; single cell electrophoresis; Biological processes; Biomembranes; Cells (biology); DNA; Electrokinetics; Frequency; Moment methods; Nanobioscience; Narrowband; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-4064-1
Electronic_ISBN
978-1-4244-4065-8
Type
conf
DOI
10.1109/PPC.2009.5386103
Filename
5386103
Link To Document