Title :
Bispectral analysis of visual field interactions
Author :
Shils, J. ; Litt, M. ; Skolnick, B. ; Sperling, M. ; Stecker, M.
Author_Institution :
Dept. of Bioeng., Pennsylvania Univ., Philadelphia, PA, USA
fDate :
31 Oct-3 Nov 1996
Abstract :
Previous electrophysiological studies have demonstrated interactions between dicoptic visual stimuli presented to the same location in visual space. In this study the authors used non-linear spectral analysis, in particular the bispectrum, to study interaction between the electrocerebral activity resulting from stimulation of the left and right visual fields. Bispectra, bicoherence and biphase were calculated for 8 subjects monocularly observing a visual stimulus. Both phase vs. frequency and biphase vs. frequency were made to determine weighted time delays from stimulus application to signal appearance in the EEG electrodes. Bispectral analysis revealed non-linear interaction between visual fields occurring with weighted delay times of 410±58 msec while non-interactive components propagated with weighted time delays of 202±39 msec. These results illustrate how bispectral analysis can be a powerful tool in analyzing the connectivity of neural networks in complex systems
Keywords :
electroencephalography; medical signal processing; spectral analysis; visual evoked potentials; 202 ms; 410 ms; EEG analysis; bicoherence; biphase; bispectra; bispectral analysis; complex systems; dicoptic visual stimuli; electrocerebral activity; electrodiagnostics; left visual field stimulation; monocular observation; neural networks connectivity analysis; noninteractive components; nonlinear interaction; nonlinear spectral analysis; right visual field stimulation; visual field interactions; weighted delay times; Delay effects; Electrodes; Electroencephalography; Frequency estimation; Frequency measurement; Nervous system; Phase measurement; Spectral analysis; Testing; Time measurement;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.652667
