Title :
Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940)
Abstract :
The following topics are dealt with: formal verification; formal specification; processor-oriented validation; decision diagram; validation pattern generation; behavioral modeling; fault coverage analysis; SAT solving; network architecture validation; high-level validation.
Keywords :
computability; decision diagrams; fault diagnosis; formal specification; formal verification; SAT solving; behavioral modeling; decision diagram; fault coverage analysis; formal specification; formal verification; high-level validation; network architecture validation; pattern generation validation; processor-oriented validation;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
Conference_Location :
Sonoma Valley, CA, USA
Print_ISBN :
0-7803-8714-7
DOI :
10.1109/HLDVT.2004.1431209
