• DocumentCode
    3201543
  • Title

    A new algorithm for high accuracy conical scan infrared earth wave

  • Author

    Hu Xianbin ; Zhao Jianhui ; Li Fan ; Yan, Zhao

  • Author_Institution
    Sch. of Instrum. Sci. & Optoelectron. Eng., Beihang Univ., Beijing, China
  • fYear
    2012
  • fDate
    11-13 July 2012
  • Firstpage
    105
  • Lastpage
    109
  • Abstract
    The satellites get accurate parameters of orbit and attitude real-timely and on-orbit from the double-cone infrared(IR) earth sensor, which is the key equipment on the satellites and very important in increasing satellites on-orbit survivability and developing space practical ability. In order to accomplish the calibration and test of infrared earth sensor, a simulating signal source is required to provide electric earth wave signals so that a closed-loop testing system can be constituted. According to the requirement of accuracy test, environment test and reliability test of infrared earth sensor, a new algorithm for high accuracy cone-scan infrared analog earth wave was proposed. The infrared earth wave simulator was developed based on the analysis and simulation of the algorithm accuracy. Test results showed that the algorithm and test equipment could satisfy the high accuracy and real-time requirements.
  • Keywords
    calibration; infrared detectors; reliability; remote sensing; calibration; closed-loop testing system; double-cone IR earth sensor; double-cone infrared Earth sensor; electric earth wave signals; high accuracy cone-scan infrared analog earth wave; high accuracy conical scan infrared Earth wave; infrared earth sensor environment testing; infrared earth sensor reliability testing; infrared earth wave simulator; satellite on-orbit survivability; Accuracy; Algorithm design and analysis; Earth; Real time systems; Satellites; Software algorithms; Testing; Earth wave algorithm; Infrared earth wave; double-cone IR Earth Senor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Control Technology (ISICT), 2012 8th IEEE International Symposium on
  • Conference_Location
    London
  • Print_ISBN
    978-1-4673-2615-5
  • Type

    conf

  • DOI
    10.1109/ISICT.2012.6291626
  • Filename
    6291626