Title :
Dynamic guiding of bounded property checking
Author :
Peranandam, Prakash M. ; Weiss, Roland J. ; Ruf, Jiirgen ; Kropf, Thomas ; Rosenstiel, Wolfgang
Author_Institution :
Dept. of Comput. Eng., Tubingen Univ., Germany
Abstract :
Current statistics attribute up to 75% of the overall design costs of digital hardware and embedded system development to the verification task. In recent years, the trend to augment functional with formal verification tries to alleviate this problem. Efficient property checking algorithms allow automatic verification of middle-sized designs nowadays. However, the steadily increasing design sizes still leave verification the major bottleneck, because formal methodologies do not yet scale to very large designs. In this paper we present the formal verification tool SymC based on forward state space traversal and so-called AR-automata for property checking, both internally represented with BDDs. Furthermore, we introduce a new methodology called dynamic guiding. This methodology best suits multimodule concurrent finite state machine (FSM) designs. The aim of guiding is to reduce the intermediate and final BDD size, which in turn makes this verification technique applicable to larger designs. Our approach exploits abstract information of the design in the form of regular expressions and effectively guides the symbolic traversal depending on the verified property.
Keywords :
binary decision diagrams; embedded systems; finite state machines; formal verification; AR-automata; BDD; SymC formal verification tool; automatic verification; bounded property checking algorithm; digital hardware; dynamic guiding; embedded system development; finite state machine design; formal verification; forward state space traversal; functional verification; regular expression; symbolic traversal; Algorithm design and analysis; Automata; Boolean functions; Costs; Data structures; Embedded system; Formal verification; Hardware; State-space methods; Statistics;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
Print_ISBN :
0-7803-8714-7
DOI :
10.1109/HLDVT.2004.1431223