Title :
Light-induced degradation in different p-i-n and n-i Schottky barrier solar cell structures
Author :
Liu, Hongyue ; Lee, Yeeheng ; Jamali-beh, T. ; Lu, Z. ; Collins, R. ; Wronski, C.R.
Author_Institution :
Electron Mater. & Process. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Abstract :
The issue of the lack of reliable correlation between the characteristics of high performance solar cells and their intrinsic material properties is addressed in this paper. A systematic approach to the question of separating the effects of the bulk from those of the interface is described which is based on the self-consistent analysis on a variety of both materials and solar cell properties in the annealed and degraded state. The results presented are on characteristics which include not only light I-V but also dark I-V and quantum efficiency of p-i-n solar cells with different thicknesses as well as on n-i-metal Schottky barrier cell structures. These results are discussed in terms of how the contributions of the bulk i-layers can be established and quantified in the annealed as well as the degraded states. An example is presented for such a quantitative correlation for a Schottky barrier cell structure in the annealed and degraded states
Keywords :
Schottky diodes; annealing; electric current measurement; semiconductor device testing; solar cells; voltage measurement; I-V characteristics; Schottky barrier solar cell structures; annealed state; bulk i-layers; degraded state; intrinsic material properties; light-induced degradation; p-i-n solar cells; quantum efficiencies; self-consistent analysis; Absorption; Annealing; Degradation; Density measurement; Materials reliability; Optical films; PIN photodiodes; Photoconducting materials; Photovoltaic cells; Schottky barriers;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564329