• DocumentCode
    3201645
  • Title

    Light-induced degradation in different p-i-n and n-i Schottky barrier solar cell structures

  • Author

    Liu, Hongyue ; Lee, Yeeheng ; Jamali-beh, T. ; Lu, Z. ; Collins, R. ; Wronski, C.R.

  • Author_Institution
    Electron Mater. & Process. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    1125
  • Lastpage
    1128
  • Abstract
    The issue of the lack of reliable correlation between the characteristics of high performance solar cells and their intrinsic material properties is addressed in this paper. A systematic approach to the question of separating the effects of the bulk from those of the interface is described which is based on the self-consistent analysis on a variety of both materials and solar cell properties in the annealed and degraded state. The results presented are on characteristics which include not only light I-V but also dark I-V and quantum efficiency of p-i-n solar cells with different thicknesses as well as on n-i-metal Schottky barrier cell structures. These results are discussed in terms of how the contributions of the bulk i-layers can be established and quantified in the annealed as well as the degraded states. An example is presented for such a quantitative correlation for a Schottky barrier cell structure in the annealed and degraded states
  • Keywords
    Schottky diodes; annealing; electric current measurement; semiconductor device testing; solar cells; voltage measurement; I-V characteristics; Schottky barrier solar cell structures; annealed state; bulk i-layers; degraded state; intrinsic material properties; light-induced degradation; p-i-n solar cells; quantum efficiencies; self-consistent analysis; Absorption; Annealing; Degradation; Density measurement; Materials reliability; Optical films; PIN photodiodes; Photoconducting materials; Photovoltaic cells; Schottky barriers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564329
  • Filename
    564329