DocumentCode
3201645
Title
Light-induced degradation in different p-i-n and n-i Schottky barrier solar cell structures
Author
Liu, Hongyue ; Lee, Yeeheng ; Jamali-beh, T. ; Lu, Z. ; Collins, R. ; Wronski, C.R.
Author_Institution
Electron Mater. & Process. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
fYear
1996
fDate
13-17 May 1996
Firstpage
1125
Lastpage
1128
Abstract
The issue of the lack of reliable correlation between the characteristics of high performance solar cells and their intrinsic material properties is addressed in this paper. A systematic approach to the question of separating the effects of the bulk from those of the interface is described which is based on the self-consistent analysis on a variety of both materials and solar cell properties in the annealed and degraded state. The results presented are on characteristics which include not only light I-V but also dark I-V and quantum efficiency of p-i-n solar cells with different thicknesses as well as on n-i-metal Schottky barrier cell structures. These results are discussed in terms of how the contributions of the bulk i-layers can be established and quantified in the annealed as well as the degraded states. An example is presented for such a quantitative correlation for a Schottky barrier cell structure in the annealed and degraded states
Keywords
Schottky diodes; annealing; electric current measurement; semiconductor device testing; solar cells; voltage measurement; I-V characteristics; Schottky barrier solar cell structures; annealed state; bulk i-layers; degraded state; intrinsic material properties; light-induced degradation; p-i-n solar cells; quantum efficiencies; self-consistent analysis; Absorption; Annealing; Degradation; Density measurement; Materials reliability; Optical films; PIN photodiodes; Photoconducting materials; Photovoltaic cells; Schottky barriers;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location
Washington, DC
ISSN
0160-8371
Print_ISBN
0-7803-3166-4
Type
conf
DOI
10.1109/PVSC.1996.564329
Filename
564329
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