• DocumentCode
    3201661
  • Title

    The evolution of ABBET

  • Author

    Heiser, John E.

  • Author_Institution
    JEH Consulting Inc., Monument, CO, USA
  • fYear
    1995
  • fDate
    8-10 Aug. 1995
  • Firstpage
    35
  • Lastpage
    40
  • Abstract
    This paper illuminates the principles and status of the ABBET (A Broad Based Environment for Test) family of IEEE standards, 1226.x, by exploring the history of the standards effort.
  • Keywords
    IEEE standards; automatic test equipment; object-oriented methods; ABBET; ATE; IEEE standards; broad-based test environment; history; Authorization; Circuit testing; Consumer electronics; Costs; Electronic equipment testing; History; Life testing; Standards Coordinating Committees; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-2621-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1995.522650
  • Filename
    522650
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3201661