DocumentCode
3201696
Title
Free flap pulse oximetry utilizing reflectance photoplethysmography
Author
Zaman, Tariq ; Kyriacou, Panayiotis A. ; Pal, Sankar K.
Author_Institution
Sch. of Eng. & Math. Sci., City Univ. London, London, UK
fYear
2013
fDate
3-7 July 2013
Firstpage
4046
Lastpage
4049
Abstract
The successful salvage of a free flap is dependent on the continuous monitoring of perfusion. To date there is no widely accepted and readily available post-operative monitoring technique to reliably assess the viability of free flaps by continuously monitoring free flap blood oxygen saturation. In an attempt to overcome the limitations of the current techniques a reflectance photoplethysmographic (PPG) processing system has been developed with the capability of real-time estimation of arterial oxygen saturation (SpO2) levels implemented in LabVIEW. This system was evaluated in clinical measurements on five patients undergoing breast reconstruction using Deep Inferior Epigastric Perforator (DIEP) flap. Good quality PPG signals were obtained from the flaps and fingers simultaneously. The estimated free flap SpO2 values were in broad agreement with the oxygen saturation readings from the commercial pulse oximeter. The results suggest that reflectance free flap photoplethysmography can be used as a continuous monitoring technique to non-invasively monitor the perfusion of free flaps.
Keywords
blood; medical signal processing; oximetry; patient monitoring; photoplethysmography; PPG signal quality; arterial oxygen saturation levels; breast reconstruction; clinical measurements; commercial pulse oximeter; continuous perfusion monitoring; deep inferior epigastric perforator flap; free flap blood oxygen saturation monitoring; free flap pulse oximetry; post-operative monitoring technique; real-time estimation; reflectance photoplethysmographic processing system; Blood; Fingers; Monitoring; Reflectivity; Sensors; Skin; Surgery;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location
Osaka
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2013.6610433
Filename
6610433
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