DocumentCode
320171
Title
Fractal analysis as a tool for a fast and effective characterization of cell morphology
Author
Hode, Y. ; Deruyver, A. ; Gaillard, S.
Author_Institution
Centre Hosp. de Rouffach, France
Volume
3
fYear
1996
fDate
31 Oct-3 Nov 1996
Firstpage
1176
Abstract
Fractal dimension (D) is an efficient criterion to characterize morphology complexity of objects. From this point of view, the authors propose to quantify the shape complexity of living cells by using fractal dimension. Here, they study the morphology of glial cells whose stages of maturation are defined in an objective manner by antigenic markers. The authors correlate the stage of maturation with the fractal dimension of the cell. Four kinds of fractal dimensions were used for individual cells: the box counting dimension, the Richardson dimension, the Minkowski dimension and the Sholl dimension. The authors´ results show that the changes of fractal dimension during differentiation follow the well known pattern of markers expression by these cells. As an alternative approach to the immunocytochemical calibration, the computation of D allows an easy and fast classification of the developmental stage of isolated living cells prior to studying their physiological characteristics
Keywords
cellular biophysics; fractals; image classification; neurophysiology; optical microscopy; Minkowski dimension; Richardson dimension; Sholl dimension; antigenic markers; box counting dimension; developmental stage classification; fast effective cell morphology characterization; glial cells; immunocytochemical calibration; living cells shape complexity quantification; markers expression pattern; maturation stage; physiological characteristics; Area measurement; Calibration; Cells (biology); Electrophysiology; Fractals; Immune system; Linear regression; Shape; Skeleton; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location
Amsterdam
Print_ISBN
0-7803-3811-1
Type
conf
DOI
10.1109/IEMBS.1996.652761
Filename
652761
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