• DocumentCode
    3201829
  • Title

    In-situ measurement of the deformation of the off-axis parabolic mirror with large aperture

  • Author

    Baiying Zou ; Huijie Zhao ; Ying Zhang

  • Author_Institution
    Key Lab. of Precision Opto-Mechatron. Technol., Minist. of Educ., Beihang Univ., Beijing, China
  • fYear
    2012
  • fDate
    11-13 July 2012
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    For the radiometric calibration of remote sensors, it is required to in-situ measure the variation of the surface shape of the large aperture off-axis parabolic mirror under simulated space condition. A digital knife-edge test method was proposed to overcome the difficulty of the interferometer for the in-situ measurement of deformation of the off-axis parabolic mirror with larger aperture. Key components of the system were selected and test system was built up. An off-axis parabolic mirror with aperture of 120 mm and focus length of 1000 mm was tested. Results show that our method is feasible. This method offers great potential in various applications pertaining to the need of in-situ measuring wave-front errors on aspheric surface in the special test condition such as space environment where interferometry are difficult to use.
  • Keywords
    calibration; deformation; light interferometers; mechanical variables measurement; mirrors; optical focusing; optical testing; radiometry; shape measurement; aspheric surface; deformation; digital knife edge test method; focus length; in-situ measurement; interferometer; large aperture off axis parabolic mirror; radiometric calibration; remote sensors; simulated space condition; surface shape measurement; wavefront errors; Educational institutions; Heat sinks; Image edge detection; Mirrors; Optical surface waves; Space heating; Standards; digital knife-edge; in-situ measurement; off-axis parabolic mirror; simulated space condition; surface shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Control Technology (ISICT), 2012 8th IEEE International Symposium on
  • Conference_Location
    London
  • Print_ISBN
    978-1-4673-2615-5
  • Type

    conf

  • DOI
    10.1109/ISICT.2012.6291639
  • Filename
    6291639