• DocumentCode
    3201876
  • Title

    ABBET architecture: baseline for test systems of the future

  • Author

    Thompson, Kirk D. ; McGarvey, Robert L. ; Rajhel, Jeff

  • Author_Institution
    Quincy Street Corp., Phoenix, AZ, USA
  • fYear
    1995
  • fDate
    8-10 Aug. 1995
  • Firstpage
    41
  • Lastpage
    50
  • Abstract
    The ABBET (A Broad Based Environment for Test) standards initiative provides a standard environment for future test systems. As a broad based standard, ABBET considers test application environments from design verification through field test and technologies from product description methods through instrument description and control. The ABBET standards group is comprised of representatives from commercial firms, government agencies, ATE manufacturers, instrument manufacturers, and test program developers. Each of these groups provide emphasis and focus on their respective areas of expertise. As a result, the interests and needs of each group are represented within the standard. This paper describes the ABBET architecture. The architecture is meant to be a roadmap for implementers and users of ABBET compliant systems. This presentation, like the standard itself, utilizes object-oriented concepts since these notions lead to a modular approach which can be easily understood and implemented.
  • Keywords
    IEEE standards; automatic test equipment; object-oriented methods; ABBET architecture; ABBET standards group; broad-based test environment; field test; future test systems; instrument description; object-oriented concepts; product description methods; standards initiative; test application environments; Feedback; Instruments; Kirk field collapse effect; Lakes; Life testing; Manufacturing; Object oriented modeling; Performance evaluation; System testing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-2621-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1995.522651
  • Filename
    522651