DocumentCode :
3201876
Title :
ABBET architecture: baseline for test systems of the future
Author :
Thompson, Kirk D. ; McGarvey, Robert L. ; Rajhel, Jeff
Author_Institution :
Quincy Street Corp., Phoenix, AZ, USA
fYear :
1995
fDate :
8-10 Aug. 1995
Firstpage :
41
Lastpage :
50
Abstract :
The ABBET (A Broad Based Environment for Test) standards initiative provides a standard environment for future test systems. As a broad based standard, ABBET considers test application environments from design verification through field test and technologies from product description methods through instrument description and control. The ABBET standards group is comprised of representatives from commercial firms, government agencies, ATE manufacturers, instrument manufacturers, and test program developers. Each of these groups provide emphasis and focus on their respective areas of expertise. As a result, the interests and needs of each group are represented within the standard. This paper describes the ABBET architecture. The architecture is meant to be a roadmap for implementers and users of ABBET compliant systems. This presentation, like the standard itself, utilizes object-oriented concepts since these notions lead to a modular approach which can be easily understood and implemented.
Keywords :
IEEE standards; automatic test equipment; object-oriented methods; ABBET architecture; ABBET standards group; broad-based test environment; field test; future test systems; instrument description; object-oriented concepts; product description methods; standards initiative; test application environments; Feedback; Instruments; Kirk field collapse effect; Lakes; Life testing; Manufacturing; Object oriented modeling; Performance evaluation; System testing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
Type :
conf
DOI :
10.1109/AUTEST.1995.522651
Filename :
522651
Link To Document :
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