• DocumentCode
    3201902
  • Title

    A GaAs MESFET large-signal circuit model for nonlinear analysis

  • Author

    Sango, M. ; Pitzalis, O. ; Lerner, L. ; McGuire, C. ; Wang, P. ; Childs, W.

  • Author_Institution
    EEsof Inc., Westlake Village, CA, USA
  • fYear
    1988
  • fDate
    25-27 May 1988
  • Firstpage
    1053
  • Abstract
    A large-signal GaAs MESFET model for performing nonlinear microwave simulations with SPICE or the Microwave SPICE and Libra programs is described. The model includes accurate analytical representation of the dependence of DC transconductance, gate-to-source capacitance, gate-to-drain capacitance, input and noise resistances, and drain-to-source resistance on operating gate-to-source and drain-to-source voltages. The model also functions as a master linear model that accurately replicates measured microwave S-parameters at arbitrarily chosen bias points within the transistor´s useful operating C-V range. Microwave SPICE harmonic distortion simulations with the model compare favorably with measurements for an NEC NE71000 GaAs MESFET.<>
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; circuit CAD; gallium arsenide; harmonic generation; nonlinear network analysis; semiconductor device models; solid-state microwave devices; C-V range; DC transconductance; GaAs; Libra programs; MESFET; MESFET model; Microwave SPICE; NE71000; NEC; SPICE; circuit CAD; drain-to-source resistance; drain-to-source voltages; gate to source voltage; gate-to-drain capacitance; gate-to-source capacitance; harmonic distortion simulations; harmonic generation; input resistance; large-signal circuit model; master linear model; microwave S-parameters; noise resistances; nonlinear analysis; nonlinear microwave simulations; Analytical models; Capacitance; Circuit noise; Circuit simulation; Distortion measurement; Gallium arsenide; MESFET circuits; Microwave measurements; SPICE; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1988., IEEE MTT-S International
  • Conference_Location
    New York, NY, USA
  • Type

    conf

  • DOI
    10.1109/MWSYM.1988.22212
  • Filename
    22212