Title :
Cathodoluminescence and REBIC study of defects in tin oxide
Author :
Maestre, D. ; Cremades, A. ; Piqueras, J.
Author_Institution :
Departmento de Fisica de Materiales, Univ. Complutense de Madrid, Spain
Abstract :
Cathodoluminescence (CL) and remote electron beam induced current (REBIC) in the scanning electron microscope (SEM) has been used to investigate the electron recombination mechanisms in tin oxide. Sintered material prepared from high purity powder has been found to show a strong dependence of the CL emission on the thermal treatments applied during sample preparation. SEM images show the presence of nano and microcrystalline grains. The correlation of the grain size and morphology with the optical emission is analysed by CL microscopy and spectroscopy. The evolution of the luminescence bands with mechanical milling shows a complex evolution of the 1.94 eV and 2.58 eV emissions which is explained by formation and recovery of defects during milling. REBIC measurements and imaging are used to characterize the formation of a potential barrier at the grain boundaries.
Keywords :
EBIC; cathodoluminescence; defect states; grain boundaries; grain size; scanning electron microscopy; tin compounds; REBIC; SnO2; cathodoluminescence; defects; electron recombination mechanisms; grain boundaries; grain size; mechanical milling; morphology; optical emission; remote electron beam induced current; scanning electron microscope; sintered material; Electron beams; Grain size; Milling; Morphology; Optical materials; Optical microscopy; Powders; Scanning electron microscopy; Spontaneous emission; Tin;
Conference_Titel :
Microelectronics, 2004. 24th International Conference on
Print_ISBN :
0-7803-8166-1
DOI :
10.1109/ICMEL.2004.1314854
