DocumentCode
3202040
Title
The Research of Memory Fault Simulation and Fault Injection Method for BIT Software Test
Author
Jun Xu ; Ping Xu
Author_Institution
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear
2012
fDate
8-10 Dec. 2012
Firstpage
718
Lastpage
722
Abstract
As the complexity of the avionics, BIT (Built-In-Test) as an important means of system self-test and fault diagnosis and fault isolation, it has been widely used in various airborne equipment. To realize the test of the board-level BIT software for avionics, this paper presented simulation-based fault-injection. A fault injector for memory fault was designed and implemented. Firstly, the principle of the memory fault simulation and fault injection was introduced. After analyzing the typical failure mode of the memory and the way to trigger fault, the memory fault model was built. Secondly, based on the open source simulator QEMU, a lot of code was modified and the fault injection module was added to support the memory unit fault simulation and decoder fault simulation. At last, an experiment was designed to validate the authenticity and validity of the fault injection tool.
Keywords
avionics; fault diagnosis; fault simulation; memory architecture; program testing; public domain software; software fault tolerance; BIT software test; QEMU; airborne equipment; avionics complexity; board-level BIT software; built-in-test; decoder fault simulation; failure mode; fault diagnosis; fault injection tool authenticity; fault injection tool validity; fault isolation; memory failure mode; memory fault injection method; memory fault simulation method; memory unit fault simulation; open source simulator; self-test system; simulation-based fault-injection; Circuit faults; Decoding; Monitoring; Random access memory; Software; Software reliability; BIT Software; Fault injection; Simulator; Testability QEMU;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation, Measurement, Computer, Communication and Control (IMCCC), 2012 Second International Conference on
Conference_Location
Harbin
Print_ISBN
978-1-4673-5034-1
Type
conf
DOI
10.1109/IMCCC.2012.174
Filename
6429009
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