Title :
A view of the ABBET upper layers
Author :
Sheppard, John W. ; Simpson, William R.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
Abstract :
Currently, the IEEE Std 1226-1993 (ABBET) is undergoing significant revision in preparation for its release as a "full-use" standard. Much of this work is motivated by a need to define the interfaces between the various "layers" of the current architecture and prepare a road map for implementing those interfaces. To date, little work has been-done on the upper layers of ABBET, yet it is believed that the upper layers offer the greatest potential for cost savings in developing advanced automatic test systems. In this paper, we address the issues of the ABBET upper layers in the context of a new architecture that is focused on addressing the needs of the upper layers.
Keywords :
IEEE standards; automatic test equipment; object-oriented methods; production testing; standardisation; ABBET upper layers; IEEE standard; advanced automatic test systems; broad-based test environment; cost savings; full-use standard; road map; Electrical capacitance tomography; Electronic equipment testing; Manufacturing; System testing;
Conference_Titel :
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-2621-0
DOI :
10.1109/AUTEST.1995.522652
