DocumentCode
3202167
Title
Characterization of the rod-pinch diode x-ray source on Cygnus
Author
Oliver, B.V. ; Berninger, M. ; Cooperstein, G. ; Cordova, S. ; Crain, D. ; Droemer, D. ; Haines, T. ; Hinshelwood, D. ; King, N. ; Lutz, S. ; Miller, C.L. ; Molina, I. ; Mosher, D. ; Nelson, D. ; Ormond, E. ; Portillo, S. ; Smith, J. ; Webb, T. ; Welch, D
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
2009
fDate
June 28 2009-July 2 2009
Firstpage
11
Lastpage
16
Abstract
The rod-pinch diode is a self-magnetically insulated electron beam diode that is capable of producing a very bright source of hard X-rays. As fielded on the Cygnus accelerator, the diode operates at an impedance of 50 Ohms and produces short pulse ( ~50 ns) bremsstrahlung radiation with a 2 MeV photon endpoint energy and dose of 4 rad measured at one meter, with an X-ray spot size ~ 1 mm. The source can be used to image through ~ 40 g/cm2 of material with spatial resolution of order 300 ¿m. Recently, a series of experiments on Cygnus have been conducted to better characterize the diode´s operation and X-ray output. In particular, the x-ray spectral content, source spot-size, and shot-to-shot reproducibility have been diagnosed. The intent of these experiments is to enable improvements that may extend the diode´s radiographic utility. An array of diagnostics have been utilized which include, end-on and side view X-ray pin hole imaging, time resolved and time integrated spot size measurements, step wedges, X-ray p-i-n diodes, and diode/MITL current measurements. High fidelity, PIC/Monte-Carlo simulations have also been conducted to help analyze the data. An overview of these experiments, simulations, and the conclusions from analysis is presented.
Keywords
Monte Carlo methods; X-ray production; X-ray scattering; bremsstrahlung; diodes; electron beams; pinch effect; Cygnus accelerator; Monte-Carlo simulations; bremsstrahlung radiation; cathode rod-pinch diode X-ray source; diode operation; diode´s radiographic utility; photon endpoint energy; self-magnetically insulated electron beam diode; used x-ray spectral content; x-ray output; x-ray pin hole imaging; Conducting materials; Electron beams; Energy measurement; Impedance measurement; Insulation; P-i-n diodes; Pulse measurements; Size measurement; Spatial resolution; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 2009. PPC '09. IEEE
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-4064-1
Electronic_ISBN
978-1-4244-4065-8
Type
conf
DOI
10.1109/PPC.2009.5386210
Filename
5386210
Link To Document