• DocumentCode
    3202187
  • Title

    Stability of large-area amorphous silicon alloy tandem solar modules

  • Author

    Chen, L. ; Willing, F. ; Yang, L. ; Li, Y.M. ; Maley, N. ; Rajan, K. ; Bennett, M. ; Arya, R.

  • Author_Institution
    Solarex Corp., Newtown, PA, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    1137
  • Lastpage
    1140
  • Abstract
    A dual bandgap, dual junction a-Si:H/a-SiGe:H solar cell has been selected as the structure to be used in Solarex´s new 10 MW solar module plant. This structure offers high initial efficiency, good stability, low material usage, and short deposition time. Thousands of one square foot and four square foot tandem modules have been produced on the Solarex pilot line, and an average of 8% stabilized efficiency on 4 square foot modules in the trial production, and 8.6% on 1 square foot modules in R&D were achieved with this structure. Good agreement was found in the stability of modules tested outdoors and indoors, and also with an array of test modules set up at NREL. An improved tandem structure with better stability is being developed by optimizing the i-layer thickness and back junction bandgap. The current loss associated with thinner i-layers was well compensated by improvements in fill factor, open-circuit voltage, and stability. Two environmental degradation modes for modules other than Staebler-Wronski effect were identified and solutions implemented
  • Keywords
    Ge-Si alloys; amorphous semiconductors; elemental semiconductors; energy gap; hydrogen; p-n heterojunctions; semiconductor device testing; semiconductor doping; silicon; solar cell arrays; solar cells; stability; 10 MW; 8 percent; 8.6 percent; R&D; Si:H-SiGe:H; Solarex pilot line; a-Si:H/a-SiGe:H tandem solar cells; back junction bandgap; environmental degradation modes; fill factor; i-layer thickness; large-area solar cell stability; open-circuit; test modules; Amorphous silicon; Degradation; Foot; Photonic band gap; Photovoltaic cells; Production; Silicon alloys; Stability; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564332
  • Filename
    564332