Title :
Utilization of the seven Ishikawa tools (old tools) in the six sigma strategy
Author :
Mach, Pavel ; Guáqueta, Jessica
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ., Prague, Czech Republic
Abstract :
Statistical process control (SPC) has become one of the most important applications of statistics in the electronics industry. It covers a variety of tools, and it can be considered that the seven Ishikawa (“old”) tools, also known as the seven quality control tools, are among the most useful and famous tools. The main goal of the use of these tools in manufacturing processes is to determine if a process being analyzed is within the established parameters (in control process) or not (out of control process). The typical property of the statistically controlled process (in control process) is that values of an investigated production parameter are between regulating limits. Through time, constant improvement has been accepted as the main objective of companies for all fields, but this improvement always retains SPC and its seven Ishikawa tools as a base. One of the latest strategies used is a six sigma strategy, which works with a base of quality statistical tools and techniques combined with well-focused management. The development of the six sigma strategy follows certain general steps established by Motorola that are analyzed from a general point of view and with reference to its relationship with SPC
Keywords :
electronic equipment manufacture; process monitoring; quality control; statistical analysis; statistical process control; SPC; constant process improvement; electronics industry; in control process; manufacturing processes; out of control process; process parameters; production parameter values; quality statistical tools; regulating parameter limits; seven Ishikawa tools; seven quality control tools; six sigma strategy; statistical process control; statistically controlled process; Industrial control; Manufacturing industries; Manufacturing processes; Process control; Production; Quality control; Quality management; Six sigma; Statistics; World Wide Web;
Conference_Titel :
Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
Conference_Location :
Calimanesti-Caciulata
Print_ISBN :
0-7803-7111-9
DOI :
10.1109/ISSE.2001.931009