• DocumentCode
    3202307
  • Title

    New flip-chip assembly system for prototyping and process investigations

  • Author

    Drozd, Z. ; Hackiewicz, H. ; Jezior, R. ; Lasocki, J. ; Lukasik, W. ; Orzechowski, J. ; Szwech, M.

  • Author_Institution
    Div. of Precision & Electron. Product Technol., Warsaw Univ. of Technol., Poland
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    68
  • Lastpage
    72
  • Abstract
    The flip-chip assembly technology and a new laboratory stand for investigation of FC bonding processes are presented. The prototype system was developed by Division of Precision and Electronic Product Technology in Institute of Precision and Biomedical Engineering of Warsaw University of Technology, in cooperation with Tele and Radio Research Institute in Warsaw. The new ideas of the system consist of application of unique measuring and positioning subsystems, assuming high precision of the chip position on the substrate. Simplicity, high precision and versatility are the main advantages of the presented system. The assembly processes are realized in prototype scale; however, the principles and physical parameters of the process are comparable with mass production processes. The stand is applied for essential tests and investigations of FC technology and materials, especially for SME. It will be also useful for didactic applications
  • Keywords
    flip-chip devices; integrated circuit interconnections; integrated circuit measurement; integrated circuit packaging; microassembling; position control; position measurement; rapid prototyping (industrial); FC bonding processes; FC technology; SME; assembly processes; chip position; flip-chip assembly; flip-chip assembly technology; laboratory stand; mass production processes; measurement precision; measuring subsystems; positioning subsystems; process investigation; process parameters; prototype system; prototyping; Assembly systems; Biomedical engineering; Biomedical measurements; Bonding processes; Laboratories; Mass production; Materials testing; Position measurement; Prototypes; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology: Concurrent Engineering in Electronic Packaging, 2001. 24th International Spring Seminar on
  • Conference_Location
    Calimanesti-Caciulata
  • Print_ISBN
    0-7803-7111-9
  • Type

    conf

  • DOI
    10.1109/ISSE.2001.931014
  • Filename
    931014